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Laser Technologies Group

Laser Technologies Group

Facilities

AFM

The atomic force microscope (AFM) is a very high-resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Atomic Force Microscope (AFM)

DMA

The differential mobility analyzer is based on the theory of electrical differential mobility. The purpose is to extract only a known size of submicron particles from the incoming poly-disperse aerosols. Before the particles enter the DMA, they are charged as they pass through an electrical charger. The charge distribution function can be obtained.

Differential Mobility Analyzer

Emergency Wash

Emergency wash station to prevent acids and other chemical toxics from damaging skin or eyes.

Emergency Wash

Femtosecond Laser

The femtosecond laser system includes a MaiTai femtosecond Ti, Sapphire seed laser, a Quanta-Ray and an Evolution nanosecond pump laser, and a TSA regenerative amplifier. The properties of this laser system are 25 mJ per pulse energy and 100 fs pulse duration at 10 Hz repetition rate.

Femtosecond Laser

Fume Hood

Protects users from inhaling chemicals by constantly pulling air into the hood and exhausting it out of the building. Fume hoods also provide protection in the event of an explosion or fire.

Fume Hood

Goggles

Protecting your eyes is essential when working with class 4 lasers.

Goggles

ICP-MS ToF

This is a time-of-flight based mass spectrometer; used to chemically analyzed ablated mass. The simultaneous nature of a time-of-flight mass spectrometer makes it suitable for the analysis of transint signals without compromising precision.

A Time-of-Flight Based Mass Spectrometer (ICP-MS ToF)

ICP-MS Quadruple
from VG Elemental

This is a quadrupole based mass spectrometer; used to chemically analyzed ablated mass.

Quadrupole Based Mass Spectrometer

Laser Ablation ns & fs

A pulsed high-powered laser beam, focused onto a sample surface, converts a finite volume of the solid instantaneoulsy into vapour and aerosol constituents.

Laser Ablation ns & fs

LIBS

Laser induced breakdown spectroscopy (LIBS) is an atomic emission spectroscopy technique that has the capability to detect, identify, and quantify the chemical composition of any material. The technique utilizes a pulsed laser focused on a small spot to create a microplasma on the sample surface. The resulting light emission is collected optically and then resolved temporally and spectrally to produce an intensity versus wavelength spectrum containing emission lines from the atomic, ionic, and molecular fragments created by the plasma.

LIBS

NSOM

NSOM utilizes a tapered, metal-coated optical fiber with a small aperture as either an excitation source or collection device. Typical spatial resolution for the fiber approach to NSOM is ˜50-100 nm, though careful probe and sample preparation have yielded ˜30 nm resolution.

NSOM

Polisher

The GPX cutter/polisher is used to create smoother, flatter samples.

Polisher

Sample Cutter

The VC-50 saw is the tool for sectioning ceramics, minerals, metals, etc.

Sample Cutter

Shadow Graph

An optical method that reveals non-uniformities in transparent media like air, water, or glass. It is related to, but simpler than, the schlieren and schlieren photography methods that perform a similar function.

Shadow Graph

Spectrometer

Device for measuring the intensity of radiation absorbed, reflected, or emitted by a material as a function of wavelength.

Spectrometer

Ultrasonic Laser Moduator

Laser ultrasonics (LUS) is a non-contact, non-destructive method we have applied to analysis of paper mechanical properties. Ultrasound can be used to probe tensile and bending stiffness and other mechanical properties in paper. These properties correlate with the speed of ultrasonic plate waves along the paper sheet. A measurement of the time-of-flight of an ultrasonic wave over the known distance between two detection points permits determination of the propagation velocity.

Ultrasonic Laser Moduator

White Light Interferometry Microsope.Zygo

The NewView 6000 optical profilers characterizes and quantifies solid samples surface roughness, step heights, critical dimensions, and other topographical features.

Zigo Machine
 
Atomic Force Microscope (AFM) Differential Mobility Analyzer (DMA) Emergency Wash Fume Hood Femtosecond Laser Goggles ICP-MS ToF ICP-MS Quadruple Laser Ablation ns & fs image Laser Induced Breakdown Spectroscopy (LIBS) Nanosecond Laser NSOM Polisher Sample Cutter Shadow Graph Spectrometer Nanosecond Laser Ultrasonic Laser Moduator White Light Interferometry Microsope.Zygo